DocumentCode
992287
Title
Robust design of low EMI susceptibility CMOS OpAmp
Author
Richelli, Anna ; Colalongo, Luigi ; Quarantelli, Michele ; Kovacs-Vajna, Zsolt Miklos
Author_Institution
Dept. of Electron., Univ. of Brescia, Italy
Volume
46
Issue
2
fYear
2004
fDate
5/1/2004 12:00:00 AM
Firstpage
291
Lastpage
298
Abstract
This paper addresses a new approach to design a CMOS operational amplifier which provides a good tradeoff between high gain and strong immunity to electromagnetic interferences. The proposed amplifier is based on two main blocks: the first is a fully differential folded cascode with modified input pair and the second is a source cross coupled AB class buffer. Thanks to the folded cascode stage and to the symmetrical output buffer, the amplifier exhibits both intrinsic robustness to interferences and good amplifier performances. The circuit was fabricated in a 0.8-μm n-well CMOS technology (AMS CYE process). Experimental results, in terms of electromagnetic interference (EMI) immunity, are presented and successfully compared with commercial amplifiers. Measurements carried out on the chip and the amplifier overall performances are provided along with the corresponding simulation results.
Keywords
CMOS integrated circuits; electromagnetic interference; immunity testing; operational amplifiers; CMOS; complementary metal-oxide semiconductor; differential folded cascode; electromagnetic interference immunity; operational amplifier; parasitic effects; symmetric topology; CMOS process; CMOS technology; Coupling circuits; Differential amplifiers; Electromagnetic interference; Electromagnetic measurements; Operational amplifiers; Performance evaluation; Robustness; Semiconductor device measurement; CMOS; immunity to electromagnetic interferences; operational amplifier; parasitic effects; slew rate; symmetric topology;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2004.826874
Filename
1300768
Link To Document