• DocumentCode
    992287
  • Title

    Robust design of low EMI susceptibility CMOS OpAmp

  • Author

    Richelli, Anna ; Colalongo, Luigi ; Quarantelli, Michele ; Kovacs-Vajna, Zsolt Miklos

  • Author_Institution
    Dept. of Electron., Univ. of Brescia, Italy
  • Volume
    46
  • Issue
    2
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    291
  • Lastpage
    298
  • Abstract
    This paper addresses a new approach to design a CMOS operational amplifier which provides a good tradeoff between high gain and strong immunity to electromagnetic interferences. The proposed amplifier is based on two main blocks: the first is a fully differential folded cascode with modified input pair and the second is a source cross coupled AB class buffer. Thanks to the folded cascode stage and to the symmetrical output buffer, the amplifier exhibits both intrinsic robustness to interferences and good amplifier performances. The circuit was fabricated in a 0.8-μm n-well CMOS technology (AMS CYE process). Experimental results, in terms of electromagnetic interference (EMI) immunity, are presented and successfully compared with commercial amplifiers. Measurements carried out on the chip and the amplifier overall performances are provided along with the corresponding simulation results.
  • Keywords
    CMOS integrated circuits; electromagnetic interference; immunity testing; operational amplifiers; CMOS; complementary metal-oxide semiconductor; differential folded cascode; electromagnetic interference immunity; operational amplifier; parasitic effects; symmetric topology; CMOS process; CMOS technology; Coupling circuits; Differential amplifiers; Electromagnetic interference; Electromagnetic measurements; Operational amplifiers; Performance evaluation; Robustness; Semiconductor device measurement; CMOS; immunity to electromagnetic interferences; operational amplifier; parasitic effects; slew rate; symmetric topology;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.826874
  • Filename
    1300768