A novel method for the characterization of LSE-type dielectric waveguides

Author

Van Deventer, T.E. ; Katehi, P.B.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

29

Issue

2

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

1584

Lastpage

1588

Abstract

A novel method is developed to calculate the propagation characteristics of dielectric ridge structures in high-frequency monolithic integrated circuits. The electric field in the dielectric ridge is expressed in terms of a polarization current from which an equivalent surface current density is defined. Generalized boundary conditions are enforced in order to provide a simple integral equation. Results derived by this modified integral equation approach give excellent agreement with other numerical methods. The main advantage of this technique is that it greatly simplifies the analysis of three-dimensional complex structures

Keywords

MMIC; dielectric waveguides; integral equations; rectangular waveguides; waveguide theory; LSE-type dielectric waveguides; dielectric ridge structures; equivalent surface current density; generalised boundary conditions; high-frequency monolithic integrated circuits; modified integral equation approach; polarization current; propagation characteristics; three-dimensional complex structures; Dielectric losses; Electromagnetic wave polarization; Frequency; Integral equations; Monolithic integrated circuits; Optical filters; Optical waveguides; Permittivity; Space technology; Strips;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.250707

Filename

250707