Title :
Multiple fault detection in fanout-free combinational networks
Author :
Hartmann, C.R.P. ; Debany, W.H. ; Varshney, Pramod K.
Author_Institution :
Syracuse University, Communication Studies Laboratory School of Computer & Information Science, Syracuse, USA
Abstract :
In this letter we show that an algorithm developed by Berger and Kohavi for generating minimal length fault-detection test sets for single permanent faults in fanout-free combinational logic networks also detects all possible multiple faults in the network.
Keywords :
combinatorial circuits; fault location; logic testing; fanout-free combinational networks; logic testing; minimal length fault-detection test sets; multiple faults; test generation algorithm;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840358
