DocumentCode :
992768
Title :
Refined method for measurement of small-signal alphas of thyristors
Author :
Silard, A. ; Kosa, Balazs
Author_Institution :
Polytechnic Institute, Department of Electronics, Bucharest, Romania
Volume :
20
Issue :
13
fYear :
1984
Firstpage :
527
Lastpage :
528
Abstract :
The letter presents a refined method for accurate measurement of small-signal current gains (alphas) of thyristors. The measurement circuit developed incorporates an original elimination procedure¿with a single tuning for the entire range of measurement frequencies¿of the spurious effect of the parasitic gate-anode capacitance Cga.
Keywords :
gain measurement; thyristors; accurate measurement; measurement circuit; parasitic gate-anode capacitance; refined method; small-signal alphas; small-signal current gains; thyristors;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19840366
Filename :
4248833
Link To Document :
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