Title :
Producing reliable initialization and test of sequential circuits with pseudorandom vectors
Author :
Soufi, M. ; Savaria, Y. ; Darlay, F. ; Kaminska, B.
Author_Institution :
Ecole Polytech., Montreal, Que., Canada
fDate :
10/1/1995 12:00:00 AM
Abstract :
In this paper, the initialization of sequential circuits using pseudorandom input patterns is addressed. An extended Markov chain model that covers the initialization phase is proposed. This model supports the theoretical framework used to demonstrate that sequential circuits can be initialized with pseudorandom vectors. This leads to a uniform BIST approach in which initialization and testing are performed together with a single pseudorandom generator
Keywords :
Markov processes; built-in self test; logic testing; sequential circuits; extended Markov chain model; initialization phase; pseudorandom vectors; reliable initialization; sequential circuits testing; single pseudorandom generator; uniform BIST approach; Automatic testing; Built-in self-test; Circuit testing; Flip-flops; Integrated circuit interconnections; Microprocessors; Multiprocessor interconnection networks; Performance evaluation; Sequential analysis; Sequential circuits;
Journal_Title :
Computers, IEEE Transactions on
