Title :
Lead alloy Josephson junction direct injection logic gates
Author :
Wang, T.C. ; Josephs, R.M. ; Young, P.L. ; Flannery, W.E. ; Stein, B.F. ; Sheppard, J.E.
Author_Institution :
Sperry Univac, Blue Bell, Penna
fDate :
5/1/1983 12:00:00 AM
Abstract :
A new group of high gain, wide margin direct injection Josephson junction logic gates including a three Josephson junction OR (3J/OR) and a four Josephson junction AND (4J/AND) was previously described. In the present work, these gates have been fabricated in an improved lead alloy technology using 5μm design rules. The measured threshold curves of the 3J/OR and the 4J/AND are in good agreement with the theoretical predictions despite the fact that current density and sheet resistance of the samples differed from the design values.
Keywords :
Josephson device logic gates; Coupling circuits; Electrodes; Gold; Insulation; Josephson junctions; Lead; Logic circuits; Logic devices; Logic gates; Resistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062280
