DocumentCode :
993078
Title :
Process characterization of Josephson packaging technology
Author :
Wang, R.H.
Author_Institution :
IBM Thomas J.Watson Research Center, Yorktown Heights, New York
Volume :
19
Issue :
3
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
811
Lastpage :
815
Abstract :
Process characterization is an essential step in the development of circuit chips and package parts for the Josephson technology. In our laboratory various test vehicles were designed with test sites to explore new designs and processes, to provide in-process and end-of-process evaluations of fabrication runs as well as to serve as powerful diagnostic tools. This article describes some of the process characterizations used in the package for the first system level test vehicle in the Josephson technology. The types of electrical characterizations, the full vertical structures, requirements of package parts and major process steps are discussed. Results from wiring, contacts, and insulation sites are used to illustrate the nature of this work and will benefit the development of a prototype machine in suggesting areas that require special attention.
Keywords :
Josephson devices; Thin-film circuit packaging; Circuit testing; Contacts; Fabrication; Insulation; Laboratories; Packaging machines; Process design; System testing; Vehicles; Wiring;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062283
Filename :
1062283
Link To Document :
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