• DocumentCode
    993078
  • Title

    Process characterization of Josephson packaging technology

  • Author

    Wang, R.H.

  • Author_Institution
    IBM Thomas J.Watson Research Center, Yorktown Heights, New York
  • Volume
    19
  • Issue
    3
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    811
  • Lastpage
    815
  • Abstract
    Process characterization is an essential step in the development of circuit chips and package parts for the Josephson technology. In our laboratory various test vehicles were designed with test sites to explore new designs and processes, to provide in-process and end-of-process evaluations of fabrication runs as well as to serve as powerful diagnostic tools. This article describes some of the process characterizations used in the package for the first system level test vehicle in the Josephson technology. The types of electrical characterizations, the full vertical structures, requirements of package parts and major process steps are discussed. Results from wiring, contacts, and insulation sites are used to illustrate the nature of this work and will benefit the development of a prototype machine in suggesting areas that require special attention.
  • Keywords
    Josephson devices; Thin-film circuit packaging; Circuit testing; Contacts; Fabrication; Insulation; Laboratories; Packaging machines; Process design; System testing; Vehicles; Wiring;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062283
  • Filename
    1062283