• DocumentCode
    993254
  • Title

    Measuring the Gap Between FPGAs and ASICs

  • Author

    Kuon, Ian ; Rose, Jonathan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont.
  • Volume
    26
  • Issue
    2
  • fYear
    2007
  • Firstpage
    203
  • Lastpage
    215
  • Abstract
    This paper presents experimental measurements of the differences between a 90-nm CMOS field programmable gate array (FPGA) and 90-nm CMOS standard-cell application-specific integrated circuits (ASICs) in terms of logic density, circuit speed, and power consumption for core logic. We are motivated to make these measurements to enable system designers to make better informed choices between these two media and to give insight to FPGA makers on the deficiencies to attack and, thereby, improve FPGAs. We describe the methodology by which the measurements were obtained and show that, for circuits containing only look-up table-based logic and flip-flops, the ratio of silicon area required to implement them in FPGAs and ASICs is on average 35. Modern FPGAs also contain "hard" blocks such as multiplier/accumulators and block memories. We find that these blocks reduce this average area gap significantly to as little as 18 for our benchmarks, and we estimate that extensive use of these hard blocks could potentially lower the gap to below five. The ratio of critical-path delay, from FPGA to ASIC, is roughly three to four with less influence from block memory and hard multipliers. The dynamic power consumption ratio is approximately 14 times and, with hard blocks, this gap generally becomes smaller
  • Keywords
    CMOS logic circuits; application specific integrated circuits; delays; field programmable gate arrays; table lookup; 90 nm; CMOS ASIC; CMOS FPGA; application-specific integrated circuits; area gap; block memory; circuit speed; core logic; critical-path delay; delay comparison; field programmable gate array; flip-flops; hard blocks; hard multipliers; logic density; look-up table-based logic; power comparison; power consumption; Application specific integrated circuits; Area measurement; CMOS logic circuits; Density measurement; Energy consumption; Field programmable gate arrays; Integrated circuit measurements; Power measurement; Programmable logic arrays; Velocity measurement; Application-specific integrated circuits (ASIC); area comparison; delay comparison; field programmable gate array (FPGA); power comparison;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2006.884574
  • Filename
    4068926