DocumentCode
993716
Title
Non-destructive read out operation of SFQ memory cells: Simulations and experimental results
Author
Matheron, G. ; Migny, Ph.
Author_Institution
L.E.T.I., Grenoble, France
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
1262
Lastpage
1265
Abstract
Single flux quantum two junction interferometers appear as attractive memory cells for constituting dense and low dissipating arrays. In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are defined, various possible designs are studied through static and dynamic simulations, experimental results for one of them are given. Finally, memory array concepts involving statistical analysis on electrical parameters spreads are proposed.
Keywords
Josephson device memories; NDRO memories; Circuit analysis computing; Fabrication; Frequency; Interferometers; Laboratories; Nonvolatile memory; Prototypes; Statistical analysis; Switches; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062344
Filename
1062344
Link To Document