• DocumentCode
    993716
  • Title

    Non-destructive read out operation of SFQ memory cells: Simulations and experimental results

  • Author

    Matheron, G. ; Migny, Ph.

  • Author_Institution
    L.E.T.I., Grenoble, France
  • Volume
    19
  • Issue
    3
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    1262
  • Lastpage
    1265
  • Abstract
    Single flux quantum two junction interferometers appear as attractive memory cells for constituting dense and low dissipating arrays. In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are defined, various possible designs are studied through static and dynamic simulations, experimental results for one of them are given. Finally, memory array concepts involving statistical analysis on electrical parameters spreads are proposed.
  • Keywords
    Josephson device memories; NDRO memories; Circuit analysis computing; Fabrication; Frequency; Interferometers; Laboratories; Nonvolatile memory; Prototypes; Statistical analysis; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062344
  • Filename
    1062344