DocumentCode :
993836
Title :
Inductance-compensated Josephson current-injection device
Author :
Kaplan, S.B. ; Gheewala, T.R. ; Mukherjee, A.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.
Volume :
19
Issue :
3
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
1238
Lastpage :
1241
Abstract :
A current-injection device (CID) can be used to perform the AND function in Josephson technology. The sensitivity of the CID operating margins to variations in the critical currents of the Josephson junctions is examined. Further, we present here a novel Compensated Current-Injection Device (CCID) in which Josephson junctions are used not only as switches, but also as inductors. This significantly increases the tolerance of the CCID to systematic variations in Josephson junction critical currents, by maintaining the effective LIoproduct invariant. Monte Carlo analyses of the threshold curves of the CID and the CCID under identical sets of assumed process variations show roughly a factor of two improvement for the CCID in the signal current operating window and also in the standard deviation of the device threshold, for cases with an arbitrarily assumed ± 20% chip-to-chip systematic variations in critical currents. The relative improvement is less if the systematic variation is smaller.
Keywords :
Josephson device logic gates; Circuits; Critical current; Data processing; Inductance; Inductors; Josephson junctions; Monte Carlo methods; Signal analysis; Signal processing; Switches;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062354
Filename :
1062354
Link To Document :
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