DocumentCode
993946
Title
A metric for line segments
Author
Nacken, Peter F M
Author_Institution
Center for Math. & Comput. Sci., Amsterdam, Netherlands
Volume
15
Issue
12
fYear
1993
fDate
12/1/1993 12:00:00 AM
Firstpage
1312
Lastpage
1318
Abstract
This correspondence presents a metric for describing line segments. This metric measures how well two line segments can be replaced by a single longer one. This depends for example on collinearity and nearness of the line segments. The metric is constructed using a new technique using so-called neighborhood functions. The behavior of the metric depends on the neighborhood function chosen. In this correspondence, an appropriate choice for the case of line segments is presented. The quality of the metric is verified by using it in a simple clustering algorithm that groups line segments found by an edge detection algorithm in an image. The fact that the clustering algorithm can detect long linear structures in an image shows that the metric is a good measure for the groupability of line segments
Keywords
geometry; image recognition; clustering algorithm; collinearity; edge detection; groupability measure; line segments; metric; nearness; neighborhood functions; Clustering algorithms; Computer science; Computer vision; Extraterrestrial measurements; Image edge detection; Image segmentation; Machine intelligence; Mathematics; Pixel;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.250848
Filename
250848
Link To Document