• DocumentCode
    993946
  • Title

    A metric for line segments

  • Author

    Nacken, Peter F M

  • Author_Institution
    Center for Math. & Comput. Sci., Amsterdam, Netherlands
  • Volume
    15
  • Issue
    12
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    1312
  • Lastpage
    1318
  • Abstract
    This correspondence presents a metric for describing line segments. This metric measures how well two line segments can be replaced by a single longer one. This depends for example on collinearity and nearness of the line segments. The metric is constructed using a new technique using so-called neighborhood functions. The behavior of the metric depends on the neighborhood function chosen. In this correspondence, an appropriate choice for the case of line segments is presented. The quality of the metric is verified by using it in a simple clustering algorithm that groups line segments found by an edge detection algorithm in an image. The fact that the clustering algorithm can detect long linear structures in an image shows that the metric is a good measure for the groupability of line segments
  • Keywords
    geometry; image recognition; clustering algorithm; collinearity; edge detection; groupability measure; line segments; metric; nearness; neighborhood functions; Clustering algorithms; Computer science; Computer vision; Extraterrestrial measurements; Image edge detection; Image segmentation; Machine intelligence; Mathematics; Pixel;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.250848
  • Filename
    250848