DocumentCode :
993949
Title :
SPICE analysis of signal propagation in Si microstrip detectors
Author :
Bacchetta, N. ; Bisello, D. ; Candelori, A. ; Paccagnella, A. ; Spada, M. ; Vanzi, M.
Author_Institution :
Istituto Nazionale di Fisica Nucl., Padova, Italy
Volume :
42
Issue :
4
fYear :
1995
fDate :
8/1/1995 12:00:00 AM
Firstpage :
459
Lastpage :
466
Abstract :
The main DC and AC characteristics of AC-coupled polysilicon-biased silicon microstrip detectors have been measured in order to determine the set of SPICE parameters of these devices based on a RC network. For this purpose each strip has been divided in 200 unit cells and simulations with 5 and 9 strips have been performed. The model is capable of calculating the interstrip and coupling impedance and phase angle in good agreement with experimental results up to a frequency of 1 MHz. The electrical propagation of a current signal simulating the charge pulse of a ionising particle along the strips has been studied. The role of the input characteristics of the read-out electronics on the detector output signals has been addressed. The signal propagation has been studied also for anomalous working conditions of the detector, such as a strip with a break in the Al film, or disconnected from the read-out electronics
Keywords :
RC circuits; detector circuits; high energy physics instrumentation computing; nuclear electronics; position sensitive particle detectors; silicon radiation detectors; 1 MHz; AC characteristics; AC-coupled polySi-biased detectors; Al; Al film break; DC characteristics; RC network; SPICE analysis; Si; anomalous working conditions; charge pulse; computer simulations; coupling impedance; current signal; detector output signals; electrical propagation; input characteristics; interstrip impedance; ionising particle; microstrip detectors; phase angle; readout electronics; signal propagation; Detectors; Employee welfare; Frequency; Impedance; Microstrip; SPICE; Signal analysis; Signal detection; Silicon; Strips;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.467801
Filename :
467801
Link To Document :
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