Title :
Signal-to-noise in silicon microstrip detectors with binary readout
Author :
DeWitt, J. ; Dorfan, D. ; Dubbs, T. ; Grillo, A. ; Hubbard, B. ; Kashigin, S. ; Noble, K. ; Pulliam, T. ; Rahn, J. ; Rowe, W.A. ; Sadrozinski, H.F.-W. ; Seiden, A. ; Spencer, E. ; Webster, A. ; Wilder, M. ; Williams, D.C. ; Ciocio, A. ; Collins, T. ; Kipn
Author_Institution :
Inst. for Particle Phys., California Univ., Santa Cruz, CA, USA
fDate :
8/1/1995 12:00:00 AM
Abstract :
We report the results of a beam test at KEK using double-sided AC-coupled silicon microstrip detectors with binary readout, i.e., a readout where the signals are discriminated in the front-end electronics and only the hit location as kept. For strip pitch between 50μ and 200μ, we determine the efficiency and the noise background as function of threshold setting. This allows us to reconstruct the Landau pulse height spectrum and determine the signal/noise ratio. In addition, the threshold/noise ratio necessary for operation with low occupancy is determined
Keywords :
position sensitive particle detectors; silicon radiation detectors; KEK beam test; Landau pulse height spectrum; Si; binary readout; double-sided AC-coupled detectors; efficiency; front-end electronics; hit location; low occupancy operation; microstrip detectors; noise background; signal-to-noise ratio; threshold setting; threshold/noise ratio; Background noise; Detectors; Electronic equipment testing; Laboratories; Microstrip; Particle beams; Pipelines; Pulse amplifiers; Silicon; Strips;
Journal_Title :
Nuclear Science, IEEE Transactions on
