DocumentCode
994043
Title
Cryosampler interface
Author
Moskowitz, P.A. ; Faris, S.M. ; Davidson, A.
Author_Institution
IBM Thomas J.Watson Research Center, Yorktown Heights, New York
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
503
Lastpage
506
Abstract
A package that permits the electrical coupling of a cryosampling system with a high temperature device has been constructed and tested. The Faris sampling system has demonstrated 5 ps time resolution and 10 μV sensitivity. The interface couples the sampler at 4.2 K to a higher temperature region, with minimal heat transfer, by means of low inductance contacts to a high quality 50 ohm thin-film transmission line. Initial time domain reflectometry tests using the sampler have been carried out over a range from liquid helium temperature to 210 K. Five reflections have been observed of a step initiated and detected by the sampler at the low temperature end and traversing a 14 cm path to the high temperature end and back, No more than 20 ps was added to the pulse risetime for one roundtrip and signals on the order of 100 μV were detected, We expect to improve this performance and to use the system for experiments on superconductors, gallium arsenide, and semiconductor devices.
Keywords
Cryogenic materials/devices; Semiconductor device measurements; Signal sampling/reconstruction; Superconducting devices; Couplings; Heat transfer; High temperature superconductors; Inductance; Packaging; Sampling methods; System testing; Temperature distribution; Temperature sensors; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062374
Filename
1062374
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