Title :
Properties of NbN/Pb Josephson tunnel junctions
Author :
van Dover, R.B. ; Bacon, D.D.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
fDate :
5/1/1983 12:00:00 AM
Keywords :
Josephson device logic circuits; Circuits; Cleaning; Electrodes; Ion beams; Niobium; Oxidation; Resists; Sputtering; Substrates; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062388
