DocumentCode :
994331
Title :
Determination of the Anisotropy Field Distribution in Perpendicular Media and Its Correlation With Microstructure and Recording
Author :
Ju, Ganping ; Bin Lu ; Van de Veerdonk, René J M ; Wu, Xiaowei ; Klemmer, Timothy J. ; Zhou, Hong ; Chantrell, Roy ; Sunder, Ashwin ; Asselin, Pierre ; Kubota, Yukiko ; Weller, Dieter
Author_Institution :
Seagate Res., Pittsburgh, PA
Volume :
43
Issue :
2
fYear :
2007
Firstpage :
627
Lastpage :
632
Abstract :
A complex transverse ac susceptibility (chiT) technique based on magneto-optical detection has been developed with sufficient sensitivity for thin-film recording media. The technique has been used to measure the dispersions in grain size and the anisotropy field of perpendicular magnetic recording media. Experiments have been designed to study the key factors contributing to the anisotropy field distribution (sigmaHk) in perpendicular media. The correlation between anisotropy dispersion, stacking faults, and recording performance have also been studied. A good correlation between stacking faults and sigmaHK has been established. Lower stacking faults result in smaller anisotropy distribution and better media signal-to-noise ratio. The main factors controlling stacking faults are studied. Theoretical studies of the effect of interactions on the chiT are also presented
Keywords :
magnetic susceptibility; magnetic thin film devices; perpendicular magnetic anisotropy; perpendicular magnetic recording; anisotropy dispersion; anisotropy field distribution; magneto-optical detection; media signal-to-noise ratio; microstructure; perpendicular magnetic recording media; recording performance; stacking faults; thin-film recording media; transverse ac susceptibility; Anisotropic magnetoresistance; Magnetic field measurement; Magnetic susceptibility; Magnetooptic effects; Magnetooptic recording; Microstructure; Perpendicular magnetic recording; Size measurement; Stacking; Transistors; AC suscptibility; anisotropy distribution; magnetic recording; perpendicular media; stacking faults;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2006.888205
Filename :
4069031
Link To Document :
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