DocumentCode
994496
Title
Conductance fluctuations and low frequency noise in Josephson junctions
Author
Rogers, C.T. ; Buhrman, R.A.
Author_Institution
Cornell University, Ithaca, NY
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
453
Lastpage
457
Abstract
We report low frequency noise measurements for small unshunted and shunted Nb-PbBi tunnel junctions and dc SQUIDS. We found that noise voltage spectral density varies as 1/fα, 
for all bias currents, scales accurately as V2at high voltage levels, and depends linearly on temperature. The results show that the low frequency noise is due to fluctuations in the tunneling conductance. These fluctuations are tentatively attributed to time variations in the occupation of defect states in the barrier.
for all bias currents, scales accurately as V2at high voltage levels, and depends linearly on temperature. The results show that the low frequency noise is due to fluctuations in the tunneling conductance. These fluctuations are tentatively attributed to time variations in the occupation of defect states in the barrier.Keywords
Josephson device noise; Fluctuations; Frequency measurement; Josephson junctions; Low-frequency noise; Noise level; Noise measurement; SQUIDs; Temperature dependence; Tunneling; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062413
Filename
1062413
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