DocumentCode :
994496
Title :
Conductance fluctuations and low frequency noise in Josephson junctions
Author :
Rogers, C.T. ; Buhrman, R.A.
Author_Institution :
Cornell University, Ithaca, NY
Volume :
19
Issue :
3
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
453
Lastpage :
457
Abstract :
We report low frequency noise measurements for small unshunted and shunted Nb-PbBi tunnel junctions and dc SQUIDS. We found that noise voltage spectral density varies as 1/fα, 
for all bias currents, scales accurately as V2at high voltage levels, and depends linearly on temperature. The results show that the low frequency noise is due to fluctuations in the tunneling conductance. These fluctuations are tentatively attributed to time variations in the occupation of defect states in the barrier.
for all bias currents, scales accurately as V2at high voltage levels, and depends linearly on temperature. The results show that the low frequency noise is due to fluctuations in the tunneling conductance. These fluctuations are tentatively attributed to time variations in the occupation of defect states in the barrier.Keywords :
Josephson device noise; Fluctuations; Frequency measurement; Josephson junctions; Low-frequency noise; Noise level; Noise measurement; SQUIDs; Temperature dependence; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062413
Filename :
1062413
Link To Document :
