DocumentCode :
994536
Title :
Measurements of the statistics of excess noise in separate absorption, grading and multiplication (SAGM) avalanche photodiodes
Author :
Kasper, B.L. ; Campbell, Joe C. ; Dentai, A.G.
Author_Institution :
AT&T Bell Laboratories, Crawford Hill Laboratory, Holmdel, USA
Volume :
20
Issue :
19
fYear :
1984
Firstpage :
796
Lastpage :
798
Abstract :
Measurements of the statistical distributions of excess noise as a function of avalanche gain and incident optical power are reported for SAGM avalanche photodiodes. The observed distributions are not Gaussian, but exhibit a `high-side¿ tail which has consequences for the performance of these APDs in optical receivers.
Keywords :
avalanche photodiodes; electric noise measurement; electron device noise; optical communication equipment; APDs; SAGM avalanche photodiodes; avalanche gain; distributions; excess noise statistics measurement; high side tail; incident optical power; nonGaussian distributions; optical receivers; performance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19840542
Filename :
4249051
Link To Document :
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