Title :
Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrate
Author :
Kolner, B.H. ; Bloom, D.M.
Author_Institution :
Stanford University, Edward L. Ginzton Laboratory, Stanford, USA
Abstract :
We report a new picosecond electro-optic sampling probe suitable for noncontact electronic characterisation of high-speed monolithic GaAs integrated circuits.
Keywords :
electro-optical devices; gallium arsenide; integrated circuit testing; monolithic integrated circuits; probes; strip lines; substrates; GaAs substrate; microstrip transmission line; monolithic GaAs integrated circuits; noncontact electronic characterisation; picosecond electrooptic sampling probe; transmission-line signals;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840556
