Title :
Rapid embedded system testing using verification patterns
Author :
Tsai, Wei-Tek ; Yu, Lian ; Zhu, Feng ; Paul, Ray
Author_Institution :
Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
Testing is often difficult, and testing real-time embedded systems for mission-critical applications is particularly difficult owing to embedded design complexities and frequent requirements changes. Embedded systems usually require a series of rigorous white-box (structural), black-box (functional), module, and integration testing before developers can release them to the market. In practice, functional testing is often more important than structural testing. Similarly, integration testing is more challenging than module testing. Furthermore, functional integration testing often requires individual test scripts based on the system requirements.
Keywords :
embedded systems; formal verification; program testing; software reusability; functional integration testing; mission-critical application; pattern verification; real-time embedded system testing; system requirement; Application software; Communication industry; Costs; Debugging; Embedded system; Life testing; Logic testing; Real time systems; System testing; Timing; Software engineering; embedded systems testing; rapid testing; scenario patterns; testing and debugging; testing tools; verification patterns;
Journal_Title :
Software, IEEE
DOI :
10.1109/MS.2005.103