• DocumentCode
    994870
  • Title

    Rapid embedded system testing using verification patterns

  • Author

    Tsai, Wei-Tek ; Yu, Lian ; Zhu, Feng ; Paul, Ray

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    22
  • Issue
    4
  • fYear
    2005
  • Firstpage
    68
  • Lastpage
    75
  • Abstract
    Testing is often difficult, and testing real-time embedded systems for mission-critical applications is particularly difficult owing to embedded design complexities and frequent requirements changes. Embedded systems usually require a series of rigorous white-box (structural), black-box (functional), module, and integration testing before developers can release them to the market. In practice, functional testing is often more important than structural testing. Similarly, integration testing is more challenging than module testing. Furthermore, functional integration testing often requires individual test scripts based on the system requirements.
  • Keywords
    embedded systems; formal verification; program testing; software reusability; functional integration testing; mission-critical application; pattern verification; real-time embedded system testing; system requirement; Application software; Communication industry; Costs; Debugging; Embedded system; Life testing; Logic testing; Real time systems; System testing; Timing; Software engineering; embedded systems testing; rapid testing; scenario patterns; testing and debugging; testing tools; verification patterns;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/MS.2005.103
  • Filename
    1463211