• DocumentCode
    994887
  • Title

    Adaptive Decomposition of Noise Sources in Digital Recording Systems With Media Noise

  • Author

    Van Beneden, Steven ; Riani, Jamal ; Bergmans, Jan W M

  • Author_Institution
    Eindhoven Univ. of Technol.
  • Volume
    43
  • Issue
    2
  • fYear
    2007
  • Firstpage
    561
  • Lastpage
    571
  • Abstract
    In digital recording systems, the total amount of data-dependent media noise increases considerably as recording densities increase. A proper noise characterization is crucial for the design of receivers for high-density storage systems. This characterization involves the selection of a proper noise model and subsequently the accurate estimation of the parameters of the selected model. The estimation algorithm proposed in this paper jointly estimates the parameters of both media and additive noise with a high accuracy. The proposed algorithm makes use of the data dependency of the media noise to distinguish between the different noise sources. The algorithm is simple and as a result can be implemented in recording systems, with only a limited amount of complexity, as an easy "add-on" to read-channel ICs. From the simulation results and the analytical derivation of the estimation algorithm, we can clearly indicate which data patterns yield near-optimal estimation performance. These patterns are the ideal test patterns in experimental systems. We propose and discuss test patterns for magnetic and optical storage systems
  • Keywords
    data recording; magnetic recording noise; optical noise; optical storage; adaptive decomposition; additive noise; data-dependent media noise; digital recording systems; estimation algorithm; high-density storage systems; magnetic channel model; magnetic storage system; near-optimal estimation performance; noise characterization; noise sources; optical storage system; read-channel IC; test patterns; Additive noise; Algorithm design and analysis; Analytical models; Digital recording; Magnetic analysis; Parameter estimation; Pattern analysis; Performance analysis; System testing; Yield estimation; Adaptation; characterization; digital recording; media noise;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.887874
  • Filename
    4069081