• DocumentCode
    995026
  • Title

    Characterization of Pb3Bi alloy surfaces by Auger spectroscopy and ion sputtering

  • Author

    Allie, G. ; Blanc, E. ; Chicault, R. ; Lauroz, C.

  • Author_Institution
    Laboratoire de Spectrométric Physique, Grenoble Cedex, France
  • Volume
    19
  • Issue
    3
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    976
  • Lastpage
    979
  • Abstract
    The surfaces of Pb3Bi films obtained through evaporation on silicon substrates are analysed by using Auger Electron Spectroscopy and ion sputtering. These films reveal a strong gradient of concentration in the vicinity of the surface. In particular, the topmost layers almost exclusively contain lead, and it is only after the removal of 200 or 300 layers that the composition reaches a constant value.
  • Keywords
    Electron spectroscopy; Ion radiation effects; Lead materials/devices; Sputtering; Superconducting materials; Bismuth; Electrons; Intensity modulation; Lead; Semiconductor films; Silicon; Spectroscopy; Sputtering; Superconducting films; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062458
  • Filename
    1062458
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=995026