Silicon detector system for high rate EXAFS applications

Author

Pullia, A. ; Kraner, H.W. ; Siddons, D.P. ; Furenlid, L.R. ; Bertuccio, G.

Author_Institution

Brookhaven Nat. Lab., Upton, NY, USA

Volume

42

Issue

4

fYear

1995

fDate

8/1/1995 12:00:00 AM

Firstpage

585

Lastpage

589

Abstract

A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications

Keywords

EXAFS; X-ray detection; X-ray spectrometers; silicon radiation detectors; -35 C; 230 to 380 eV; EXAFS; Extended X-ray Absorption Fine Structure; Peltier cells; Si; X-ray spectroscopic measurements; cooling system; energy resolution; multichannel silicon pad detector; shot noise contribution; Cooling; Electromagnetic wave absorption; Electrons; Energy measurement; Energy resolution; Silicon; Spectroscopy; Temperature; X-ray detection; X-ray detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.467909

Filename

467909