DocumentCode :
995184
Title :
Quantum noise in Josephson-junction parametric amplifiers
Author :
Kuzmin, L.S. ; Likharev, K.K. ; Migulin, V.V. ; Zorin, A.B.
Author_Institution :
Moscow State University, Moscow, USSR.
Volume :
19
Issue :
3
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
618
Lastpage :
621
Abstract :
Crossover between thermal and quantum noise in the externally-pumped Josephson-junction parametric amplifiers is theoretically followed. Two different approaches are used for the analysis : i. Josephson junction is replaced with its RSJ model with the equilibrium source of fluctuations; ii. microscopic theory of the tunnel junctions is used, which takes into account not only thermal and quantum but also shot noise. Because of inconvenience of the noise temperature TNfor the amplifier sensitivity characterization in the quantum limit, we express our results in terms of the figure ΘNwhich is essentially the amplifier output noise energy, reduced to its input (in the classical limit, \\Theta _{N}=k_{B}T_{N} ). For the nondegenerate amplifier, the minimum value of ΘN. equals hω/2 and is due to quantum noise (zero-point oscillations) in the idle-frequency resonator of the amplifier. For the degenerate amplifier, sensitive to only one quadrature component of the input signal, ΘNcan be made much less than the above "quantum limit" even at operation temperatures much higher than \\hom ega/k_{B} , if the Josephson junction characteristic frequency ωcis high enough, h\\omega_{c}g\\sim k_{B}T . Our analysis of the experimental situatlon shows that the values \\Theta _{N}< \\hom ega/2 can be achieved using two-dimensional arrays of a large number ( N\\simeq 100 ) single-tunnel-junction interferometers with low inductances, inductively coupled to a microwave cavity.
Keywords :
Amplifier noise; Josephson device amplifiers; Parametric amplifiers; Fluctuations; Frequency; Josephson junctions; Microscopy; Microwave antenna arrays; Noise figure; Noise reduction; Operational amplifiers; Quantum mechanics; Temperature sensors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062472
Filename :
1062472
Link To Document :
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