DocumentCode
995271
Title
Transient response of tin microstrips to supercritical current pulses
Author
Butler, D. ; Hsiang, Thomas ; Mourou, Gerard
Author_Institution
University of Rochester, Rochester, NY
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
644
Lastpage
647
Abstract
We have measured the transient response of tin microstrips to short current pulses whose amplitude exceeded the dc critical current Ic of the sample. The current pulses were generated by an electro-optic switching technique. The voltage across the microstrip was measured indirectly by integrating the sample into a transmission line and measuring the transmission characteristics. For a fixed pulse duration, no voltage was measured until a threshold Ic1 (>Ic ) was reached. Above Ic1 , the voltage developed at a delay time of τd . When current amplitude exceeded a second threshold Ic2 , the voltage onset occurred with no observable delay. These results were partially explained by existing theories that employed TDGL calculations.
Keywords
Microstrip; Pulse measurement; Superconducting devices; Tin materials/devices; Transient analysis; Critical current; Current measurement; Delay; Microstrip; Pulse generation; Pulse measurements; Threshold voltage; Tin; Transient response; Transmission line measurements;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062480
Filename
1062480
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