• DocumentCode
    995271
  • Title

    Transient response of tin microstrips to supercritical current pulses

  • Author

    Butler, D. ; Hsiang, Thomas ; Mourou, Gerard

  • Author_Institution
    University of Rochester, Rochester, NY
  • Volume
    19
  • Issue
    3
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    644
  • Lastpage
    647
  • Abstract
    We have measured the transient response of tin microstrips to short current pulses whose amplitude exceeded the dc critical current Icof the sample. The current pulses were generated by an electro-optic switching technique. The voltage across the microstrip was measured indirectly by integrating the sample into a transmission line and measuring the transmission characteristics. For a fixed pulse duration, no voltage was measured until a threshold Ic1(>Ic) was reached. Above Ic1, the voltage developed at a delay time of τd. When current amplitude exceeded a second threshold Ic2, the voltage onset occurred with no observable delay. These results were partially explained by existing theories that employed TDGL calculations.
  • Keywords
    Microstrip; Pulse measurement; Superconducting devices; Tin materials/devices; Transient analysis; Critical current; Current measurement; Delay; Microstrip; Pulse generation; Pulse measurements; Threshold voltage; Tin; Transient response; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062480
  • Filename
    1062480