Title :
New application of a single six-port reflectometer
Author_Institution :
Chengdu Institute of Radio Engineering, Applied Physics Institute, Chengdu, China
Abstract :
Based on the wave-superposition principle and the equivalent-circuit principle, a new circuit of a single six-port reflectometer is designed. It may be used for measuring any two-port device. The method of calibration and measurement of the circuit is given.
Keywords :
calibration; microwave reflectometry; network analysers; calibration; equivalent-circuit principle; microwave measurement; six-port reflectometer; two port device measurement; wave-superposition principle;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840626
