DocumentCode :
995431
Title :
Guest Editors´ Introduction: Design for Yield and Reliability
Author :
Zorian, Y. ; Gizopoulos, D. ; Vandenberg, C. ; Magarshack, P.
Author_Institution :
Virage Logic
Volume :
21
Issue :
3
fYear :
2004
Firstpage :
177
Lastpage :
182
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Alpha particles; Conductors; Crosstalk; Delay; Electromagnetic interference; Electromagnetic transients; Feedback loop; Manufacturing processes; Neutrons; Voltage;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2004.12
Filename :
1302083
Link To Document :
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