Title :
Reconfigurable architecture for autonomous self-repair
Author :
Mitra, Subhasish ; Huang, Wei-Je ; Saxena, Nirmal R. ; Yu, Shu-Yi ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
Fault-tolerant systems typically require expensive additional resources (spare pins, columns, and chips) and external control for reconfiguration. We introduce an effective, low-cost repair solution in which originally unused blocks and routing resources replace faulty parts. In addition, the proposed reconfiguration hardware allows autonomous repair, that is, the system does not require external intervention for recovery.
Keywords :
built-in self test; fault location; fault tolerance; field programmable gate arrays; logic testing; reconfigurable architectures; autonomous self-repair; built-in self test; fault location; fault-tolerant system; field programmable gate arrays; logic testing; reconfigurable architecture; Control systems; Fault tolerant systems; Field programmable gate arrays; Hardware; Pins; Random access memory; Reconfigurable architectures; Reconfigurable logic; Routing; Wiring;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.18
