DocumentCode
995534
Title
An approximate-analytic solution for the forward-biased step junction
Author
Schrimpf, R.D. ; Warner, R.M., Jr.
Author_Institution
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Volume
35
Issue
5
fYear
1988
fDate
5/1/1988 12:00:00 AM
Firstpage
698
Lastpage
700
Abstract
Approximate-analytic methods for analyzing semiconductor samples containing junctions complement purely numerical solutions by providing added physical insight. These methods have proved useful, but have been applicable primarily to samples at equilibrium. A technique for applying these methods to forward-biased junctions is described. The equations obtained are compatible with previously published work
Keywords
electric potential; p-n junctions; semiconductor junctions; approximate-analytic solution; forward-biased step junction; numerical solutions; p-n junction; potential distribution; semiconductor junction; semiconductor samples; Charge carrier lifetime; Closed-form solution; Doping; Neodymium; Poisson equations;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.2515
Filename
2515
Link To Document