• DocumentCode
    995797
  • Title

    Exploiting Narrow Values for Soft Error Tolerance

  • Author

    Ergin, Oguz ; Unsal, Osman ; Vera, Xavier ; González, Antonio

  • Author_Institution
    TOBB Univ. of Econ. & Technol., Ankara
  • Volume
    5
  • Issue
    2
  • fYear
    2006
  • Firstpage
    12
  • Lastpage
    12
  • Abstract
    Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. In this paper we propose simple mechanisms that effectively reduce the vulnerability to soft errors In a processor. Our designs are generally motivated by the fact that many of the produced and consumed values in the processors are narrow and their upper order bits are meaningless. Soft errors canted by any particle strike to these higher order bits can be avoided by simply identifying these narrow values. Alternatively soft errors can be detected or corrected on the narrow values by replicating the vulnerable portion of the value inside the storage space provided for the upper order bits of these operands. We offer a variety of schemes that make use of narrow values and analyze their efficiency in reducing soft error vulnerability of level-1 data cache of the processor
  • Keywords
    cache storage; error correction; error detection; microprocessor chips; radiation effects; system recovery; transients; contemporary microprocessors; data cache; error correction; narrow values; particle strike; soft error tolerance; transient errors; Cache storage; Error correction; Hardware; Impurities; Manufacturing; Microprocessors; Multithreading; Neutrons; Process design; Random access memory; Data Cache; Error Correction; Narrow Values; Soft Errors;
  • fLanguage
    English
  • Journal_Title
    Computer Architecture Letters
  • Publisher
    ieee
  • ISSN
    1556-6056
  • Type

    jour

  • DOI
    10.1109/L-CA.2006.12
  • Filename
    4069169