• DocumentCode
    996277
  • Title

    Considerations on the Relationship Between Dosimetry Metrics and Experimental Conditions

  • Author

    Griffin, Patrick J. ; Vehar, David W. ; Cooper, Phillip J. ; King, Donald B.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM
  • Volume
    54
  • Issue
    6
  • fYear
    2007
  • Firstpage
    2288
  • Lastpage
    2295
  • Abstract
    Analysts, experimenters, and facilities have fallen into some poor practices in reporting many dosimetry metrics. While the experienced dosimetrist often knows the caveats that apply for a given dosimetry application, without proper reporting critical information is often lost before the data is received by the dosimetrist. In addition, the newcomers to the application of dosimetry are not being educated in the importance of a variation in the irradiation conditions. This paper captures some of the cases where care must be taken in expressing the proper context for a dosimetry metric. Examples focus on the interpretation of the response of a diamond photoconducting detector and a silicon transistor and highlight some common mistakes and some not-so-clear misinterpretations that even the experienced person often makes in this field. A careful study of the underlying physics reveals the non-intuitive trends in some metrics. Suggestions are made on how the community can minimize the chance of a dosimetry-related misinterpretation.
  • Keywords
    dosimetry; neutron detection; photoconducting devices; silicon radiation detectors; diamond photoconducting detector; dosimetrist; dosimetry metrics; irradiation conditions; neutron detectors; silicon radiation detectors; silicon transistor; Amino acids; Biological materials; Dosimetry; Laboratories; Neutrons; Photoconductivity; Physics; Radiation detectors; Silicon radiation detectors; Uncertainty; 1-MeV(Si) damage; Bipolar transistors; dose; dosimetry; dpa; neutron detectors; silicon radiation detectors; uncertainty;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2007.910293
  • Filename
    4395031