Title :
Lateral Diffusion Length Changes in HgCdTe Detectors in a Proton Environment
Author :
Hubbs, John E. ; Marshall, Paul W. ; Marshall, Cheryl J. ; Gramer, Mark E. ; Maestas, Diana ; Garcia, John P. ; Dole, Gary A. ; Anderson, Amber A.
Author_Institution :
Ball Aerosp. & Technol. Corp., Albuquerque
Abstract :
This paper presents a study of the performance degradation in a proton environment of long wavelength infrared (LWIR) HgCdTe detectors. The energy dependence of the Non-Ionizing Energy Loss (NIEL) in HgCdTe provides a framework for estimating the responsivity degradation in LWIR HgCdTe detectors due to on-orbit exposure from protons. Banded detector arrays of different detector designs were irradiated at proton energies of 7, 12, and 63 MeV. These banded detector arrays allowed insight into how the fundamental detector parameters degraded in a proton environment at the three different proton energies. Measured data demonstrated that the detector responsivity degradation at 7 MeV is 5 times larger than the degradation at 63 MeV. Comparison of the responsivity degradation at the different proton energies suggests that the atomic Columbic interaction of the protons with the HgCdTe detector is likely the primary mechanism responsible for the degradation in responsivity at proton energies below 30 MeV.
Keywords :
cadmium compounds; energy loss of particles; infrared detectors; mercury compounds; proton effects; semiconductor counters; ternary semiconductors; HgCdTe; HgCdTe detectors; atomic Columbic interaction; banded detector arrays; electron volt energy 12 MeV; electron volt energy 63 MeV; electron volt energy 7 MeV; lateral diffusion length; long wavelength infrared detectors; nonionizing energy loss; performance degradation; proton environment; proton irradiation; responsivity degradation; Atomic measurements; Degradation; Diodes; Energy loss; Infrared detectors; Infrared imaging; Ionization; Protons; Radiation detectors; Sensor arrays; HgCdTe detectors; Non-Ionizing Energy Loss (NIEL); proton radiation effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.910329