DocumentCode
996412
Title
LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance
Author
Johnston, A.H. ; Miyahira, T.F.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Volume
54
Issue
6
fYear
2007
Firstpage
2450
Lastpage
2456
Abstract
Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.
Keywords
hardness; light emitting diodes; opto-isolators; radiation effects; LED technologies; forward diode characteristics; hardness assurance; optocouplers; radiation damage; radiation-tolerant devices; Absorption; Degradation; Light emitting diodes; Manufacturing; Photodetectors; Propulsion; Radiation detectors; Silicon; Space technology; Testing; Hardness assurance; light-emitting diode; optocoupler; radiation effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2007.909910
Filename
4395043
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