Title :
LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance
Author :
Johnston, A.H. ; Miyahira, T.F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.
Keywords :
hardness; light emitting diodes; opto-isolators; radiation effects; LED technologies; forward diode characteristics; hardness assurance; optocouplers; radiation damage; radiation-tolerant devices; Absorption; Degradation; Light emitting diodes; Manufacturing; Photodetectors; Propulsion; Radiation detectors; Silicon; Space technology; Testing; Hardness assurance; light-emitting diode; optocoupler; radiation effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.909910
