Title :
Probabilistic Evaluation of Analog Single Event Transients
Author :
Kauppila, Amy V. ; Vaughn, Gregg L. ; Kauppila, Jeffrey S. ; Massengill, Lloyd W.
Author_Institution :
InfoWorks Inc., Nashville
Abstract :
We propose a procedure to estimate the consequences of an analog single event transient (ASET). The method qualifies ASETs based on their frequency domain signatures and determines the probability of a single event transient induced error.
Keywords :
operational amplifiers; radiation effects; analog circuit; analog single event transients; frequency domain signatures; operational amplifier; probabilistic evaluation; radiation effects; single event transient induced error; Analog circuits; Circuit noise; Context; Fourier transforms; Frequency domain analysis; Histograms; Ionizing radiation; Operational amplifiers; Qualifications; Radiation effects; Analog single-event transients; Fourier transforms; integral square error; operational amplifier;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.910166
