Title :
Statistical Properties of SEE Rate Calculation in the Limits of Large and Small Event Counts
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt
Abstract :
We develop a maximum likelihood method for bounding single-event effect (SEE) rates at a particular confidence level. The method is useful for test planning, reliability estimates and investigating rare SEE modes and part-to-part and lot-to-lot variability.
Keywords :
maximum likelihood estimation; quality assurance; radiation effects; reliability; SEE rate calculation; maximum likelihood method; quality assurance; radiation effects; reliability estimation; single-event effect mechanisms; statistical properties; Data analysis; Electronic equipment testing; Electronics industry; Energy exchange; Error analysis; Fluctuations; Maximum likelihood estimation; Radiation effects; Statistical analysis; Upper bound; Quality assurance; radiation effects; reliability estimation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.910035
