• DocumentCode
    996622
  • Title

    A unified framework for generating all propagation functions for logic errors and events

  • Author

    Michael, Maria K. ; Haniotakis, Themistoklis ; Tragoudas, Spyros

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Cyprus, Nicosia, Cyprus
  • Volume
    23
  • Issue
    6
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    980
  • Lastpage
    986
  • Abstract
    We present a generic framework that supports efficient generation of the traditional Boolean difference function of some output with respect to any line in a combinational circuit, which is important when testing for logic defects. The framework also allows for the generation of generalized Boolean difference functions, which reflect sensitivity on event propagation from a given line to some circuit output. This generalized function could apply in timing verification, analysis, and test. We implemented the proposed framework using various function representation environments, including binary decision diagrams, Boolean expression diagrams, and Boolean networks, and report experimental results on the ISCAS´85 and ISCAS´89 benchmarks.
  • Keywords
    Boolean functions; automatic test pattern generation; binary decision diagrams; combinational circuits; logic simulation; logic testing; sequential circuits; Boolean difference function; Boolean expression diagrams; Boolean networks; ISCAS 85 benchmark; ISCAS 89 benchmarks; automatic test pattern generation; binary decision diagrams; combinational circuit; delay testing; event propagation; function representation environments; logic defect testing; logic errors; logic events; propagation functions; timing analysis; timing verification; unified framework; Automatic test pattern generation; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Computer errors; Data structures; Fault detection; Logic testing; Timing; ATPG; Automatic test pattern generation; delay testing; testing; timing analysis; verification;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2004.828112
  • Filename
    1302197