• DocumentCode
    996636
  • Title

    Improved Hamming-distance analysis for digital learning networks

  • Author

    Stonham, T.J.

  • Author_Institution
    University of Kent at Canterbury, Electronics Laboratories, Canterbury, UK
  • Volume
    13
  • Issue
    6
  • fYear
    1977
  • Firstpage
    155
  • Lastpage
    156
  • Abstract
    A method for calculating the response of a single-layer network pattern-recognition system is presented. To obtain accurate prediction of the network response, it is necessary to consider the Hamming distances between training patterns. The method is demonstrated with reference to an alphanumeric recognition test.
  • Keywords
    learning systems; pattern recognition; random-access storage; Hamming distance analysis; alphanumeric recognition test; digital learning networks; random access memories; single layer network pattern recognition system;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19770110
  • Filename
    4249255