DocumentCode
996636
Title
Improved Hamming-distance analysis for digital learning networks
Author
Stonham, T.J.
Author_Institution
University of Kent at Canterbury, Electronics Laboratories, Canterbury, UK
Volume
13
Issue
6
fYear
1977
Firstpage
155
Lastpage
156
Abstract
A method for calculating the response of a single-layer network pattern-recognition system is presented. To obtain accurate prediction of the network response, it is necessary to consider the Hamming distances between training patterns. The method is demonstrated with reference to an alphanumeric recognition test.
Keywords
learning systems; pattern recognition; random-access storage; Hamming distance analysis; alphanumeric recognition test; digital learning networks; random access memories; single layer network pattern recognition system;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19770110
Filename
4249255
Link To Document