DocumentCode :
996736
Title :
An approximation formula for the secondary emission yield
Author :
Abuelma´atti, Muhammad Taher
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Bahrain Univ., Isa Town
Volume :
37
Issue :
6
fYear :
1990
fDate :
6/1/1990 12:00:00 AM
Firstpage :
1590
Lastpage :
1591
Abstract :
An algorithm for obtaining analytical expressions for the normalized secondary emission ratio δ/δmax as a function of the normalized impact voltage is presented. These expressions are well suited for implementation on personal or mainframe computers with a very high accuracy over the whole range of the normalized impact voltage
Keywords :
electronic engineering computing; secondary electron emission; algorithm; analytical expressions; approximation formula; high accuracy; mainframe computer implementation; normalized impact voltage; normalized secondary emission ratio; personal computer implementation; secondary emission yield; Algorithm design and analysis; Cities and towns; Electron tubes; Fourier series; Image generation; Image segmentation; Instruction sets; Mirrors; Virtual manufacturing; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.106261
Filename :
106261
Link To Document :
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