• DocumentCode
    996736
  • Title

    An approximation formula for the secondary emission yield

  • Author

    Abuelma´atti, Muhammad Taher

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Bahrain Univ., Isa Town
  • Volume
    37
  • Issue
    6
  • fYear
    1990
  • fDate
    6/1/1990 12:00:00 AM
  • Firstpage
    1590
  • Lastpage
    1591
  • Abstract
    An algorithm for obtaining analytical expressions for the normalized secondary emission ratio δ/δmax as a function of the normalized impact voltage is presented. These expressions are well suited for implementation on personal or mainframe computers with a very high accuracy over the whole range of the normalized impact voltage
  • Keywords
    electronic engineering computing; secondary electron emission; algorithm; analytical expressions; approximation formula; high accuracy; mainframe computer implementation; normalized impact voltage; normalized secondary emission ratio; personal computer implementation; secondary emission yield; Algorithm design and analysis; Cities and towns; Electron tubes; Fourier series; Image generation; Image segmentation; Instruction sets; Mirrors; Virtual manufacturing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.106261
  • Filename
    106261
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=996736