Title :
Domain Crossing Errors: Limitations on Single Device Triple-Modular Redundancy Circuits in Xilinx FPGAs
Author :
Quinn, Heather ; Morgan, Keith ; Graham, Paul ; Krone, Jim ; Caffrey, Michael ; Lundgreen, Kevin
Author_Institution :
Los Alamos Nat. Lab., Los Alamos
Abstract :
This paper discusses the limitations of single-FPGA triple-modular redundancy in the presence of multiple-bit upsets on Xilinx Virtex-II devices. This paper presents results from both fault injection and accelerated testing. From this study we have found that the configurable logic block´s routing network is vulnerable to domain crossing errors, or TMR defeats, by even 2-bit multiple-bit upsets.
Keywords :
aerospace instrumentation; field programmable gate arrays; proton effects; Xilinx FPGA; Xilinx Virtex-II devices; accelerated testing; configurable logic block routing network; domain crossing errors; fault injection; fault tolerance; field programmable gate arrays; hardness measurement; multiple-bit upsets; proton radiation effects; radiation hardening; redundant systems; single device triple-modular redundancy circuits; single-FPGA triple-modular redundancy; Circuit faults; Circuit testing; Costs; Field programmable gate arrays; Hardware; Laboratories; Life estimation; Logic programming; Random access memory; Redundancy; Fault tolerance; field programmable gate arrays; hardness measurement; proton radiation effects; radiation hardening; redundant systems;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.910870
