Abstract :
With 16K RAM chips already in commercial use and 64K RAM chips being planned, the increasing length of time needed to run test patterns could lead to cost increases that would offset the advantages of the larger devices. For example, many existing tests of the important pattern-sensitive-fault class, such as galloping 0´s and 1´s,* require a test length proportional to the square of the number of bits in the RAM chip.1-4Clearly, the time consumed by such tests looms as a major component in the overall costs of chip production.
