Title :
Effects of Electric Shock-II
Author :
Kouwenhoven, W.B. ; Langworthy, O.R.
Author_Institution :
Professor of Elec. Engg., Johns Hopkins University, Baltimore, Md.
Keywords :
Circuit testing; Electric shock; Electrodes; Voltage measurement;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1931.5055931
