Title :
S2I: a switched-current technique for high performance
Author :
Hughes, J.B. ; Moulding, K.W.
Author_Institution :
Philips Res, Labs. Redhill, UK
Abstract :
A new switched-current memory cell is presented which enhances basic cell performance through successive refinement of the memorised sample. This is achieved in a two-step technique, called S2I, in which the input sample is coarsely memorised, a process which introduces a combination of all the normal errors followed by detection and suppression of the combined errors. The circuit solution requires the addition to the basic memory cell of only extra switches and so carries few of the penalties associated with alternative techniques.
Keywords :
analogue storage; switched networks; S 2I technique; cell performance; circuit solution; combined errors; normal errors; successive refinement; switched-current memory cell; switched-current technique; two-step technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19930938