DocumentCode :
997015
Title :
Test Sequencing in Complex Manufacturing Systems
Author :
Boumen, R. ; De Jong, I. S M ; Vermunt, J. W H ; van de Mortel-Fronczak, J.M. ; Rooda, J.E.
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven
Volume :
38
Issue :
1
fYear :
2008
Firstpage :
25
Lastpage :
37
Abstract :
Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, which is the test-sequencing problem, was already solved by Pattipati et al. for the diagnosis of systems during operation. Test-sequencing problems during the development and manufacturing phases of systems, however, require a different approach than the test-sequencing problems during operation. In this paper, the test problem description and algorithms developed by Pattipati et al. are extended to solve test-sequencing problems for the development and manufacturing of manufacturing systems. For a case study in the manufacturing process of an ASML lithographic machine, it is shown that solving a test-sequencing problem with this method can reduce the test time by 15% to 30% compared to experts that solve this problem manually.
Keywords :
integrated circuit manufacture; lithography; manufacturing systems; production equipment; production testing; ASML lithographic machine; complex manufacturing systems; test sequencing; Electronics industry; Lithography; Manufacturing industries; Manufacturing processes; Manufacturing systems; Semiconductor device testing; Sequential analysis; Sequential diagnosis; System testing; Time to market; and/or graphs; AND/OR graphs; TANGRAM; manufacturing systems; semiconductor industry; test sequencing; test strategy;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
Publisher :
ieee
ISSN :
1083-4427
Type :
jour
DOI :
10.1109/TSMCA.2007.909494
Filename :
4395096
Link To Document :
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