DocumentCode :
997331
Title :
Measured surface spectrum dependence of backscattering from rough surface
Author :
Rouse, John W., Jr. ; Moore, RICHARD K.
Author_Institution :
Texas A&M Univ., College Station, TX USA
Volume :
20
Issue :
2
fYear :
1972
fDate :
3/1/1972 12:00:00 AM
Firstpage :
211
Lastpage :
214
Abstract :
The wavelength dependence of backscatter from a smoothly undulating randomly rough surface was measured over a broad continuous range of wavelengths using acoustic waves in water. The experiment resulted in discovering a transition region in which the wavelength dependence changed abruptly from \\lambda ^{0} to \\lambda ^{+3} , apparently due to change in the surface height spectrum. The wavelength dependence corresponded to the measured surface height spectrum through the transition region in the manner predicted by the composite surface model formulated by Wright and others. A similar spectrum-dependent effect has been found in broad-spectrum electromagnetic measurements of natural surfaces.
Keywords :
Acoustic scattering; Electromagnetic (EM) scattering by rough surfaces; Rough surfaces; Sea surface; Acoustic measurements; Acoustic waves; Backscatter; Electromagnetic measurements; Predictive models; Rough surfaces; Surface acoustic waves; Surface roughness; Surface waves; Wavelength measurement;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.1972.1140170
Filename :
1140170
Link To Document :
بازگشت