DocumentCode :
997336
Title :
Integrated CMOS transmit-receive switch using LC-tuned substrate bias for 2.4-GHz and 5.2-GHz applications
Author :
Talwalkar, Niranjan A. ; Yue, C. Patrick ; Gan, Haitao ; Wong, S. Simon
Author_Institution :
IRF Semicond. USA, Cupertino, CA, USA
Volume :
39
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
863
Lastpage :
870
Abstract :
CMOS transmit-receive (T/R) switches have been integrated in a 0.18-μm standard CMOS technology for wireless applications at 2.4 and 5.2 GHz. This switch design achieves low loss and high linearity by increasing the substrate impedance of a MOSFET at the frequency of operation using a properly tuned LC tank. The switch design is asymmetric to accommodate the different linearity and isolation requirements in the transmit and receive modes. In the transmit mode, the switch exhibits 1.5-dB insertion loss, 28-dBm power, 1-dB compression point (P1dB), and 30-dB isolation, at 2.4 and 5.2 GHz. In the receive mode, the switch achieves 1.6-dB insertion loss, 11.5-dBm P1dB, and 15-dB isolation, at 2.4 and 5.2 GHz. The linearity obtained in the transmit mode is the highest reported to date in a standard CMOS process. The switch passes the 4-kV Human Body Model electrostatic discharge test. These results show that the switch design is suitable for narrow-band applications requiring a moderate-high transmitter power level (<1 W).
Keywords :
CMOS integrated circuits; MOSFET; field effect transistor switches; microwave integrated circuits; microwave switches; 1.5 dB; 2.4 GHz; 5.2 GHz; CMOS integrated circuits; CMOS process; CMOS technology; CMOS transmit-receive switch; LC tank; LC-tuned substrate bias; MOSFET switches; RF CMOS switch; T/R switch; electrostatic discharge test; human body model; insertion loss; microwave switches; moderate-high transmitter power level; narrow-band applications; receive modes; substrate impedance; transmit modes; wireless applications; CMOS process; CMOS technology; Frequency; Impedance; Insertion loss; Isolation technology; Linearity; MOSFET circuits; Propagation losses; Switches; CMOS integrated circuits; MOSFET switches; RF CMOS switch; T/R switch; microwave switches;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.827809
Filename :
1302263
Link To Document :
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