DocumentCode
997375
Title
The design of a charge-integrating modified floating-point ADC chip
Author
Zimmerman, Tom ; Hoff, James R.
Author_Institution
Fermi Nat. Accel. Lab., USA
Volume
39
Issue
6
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
895
Lastpage
905
Abstract
One of the challenges posed by calorimeters in high-energy physics experiments is digitizing wide dynamic range charge signals at high rate to a specified precision. One response to this challenge is the development of the QIE (charge integrator and encoder) concept. A QIE chip divides the input signal into multiple ranges, with each range integrating a scaled fraction of the signal. The range integrators are offset so that for any given signal magnitude, only one range will be selected as valid. The selected range integrator output is digitized to form a mantissa, and a digital code associated with that range forms an exponent. The resulting modified floating-point output format gives approximately constant measurement precision over a wide dynamic range. Floating-point converter designs are usually tailored for a specific application. A general description of the QIE concept shows how parameters are chosen to suit the application. The design of a mixed-signal chip that has been produced for a specific experiment is presented.
Keywords
BiCMOS analogue integrated circuits; analogue-digital conversion; floating point arithmetic; integrated circuit design; mixed analogue-digital integrated circuits; BiCMOS analog integrated circuits; QIE chip; calorimeters; charge integrator; charge-integrating; digital code; encoder; floating-point analog-digital conversion; floating-point converter designs; high-energy physics experiments; mixed analog-digital integrated circuits; mixed-signal chip; modified floating-point ADC chip; range integrators; signal magnitude; wide dynamic range charge signals; Analog integrated circuits; BiCMOS integrated circuits; Dynamic range; Energy resolution; Photodetectors; Physics; Piecewise linear approximation; Pulse generation; Semiconductor device measurement; Signal resolution; Analog–digital conversion; BiCMOS analog integrated circuits; floating-point analog–digital conversion; mixed analog–digital integrated circuits;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2004.827808
Filename
1302266
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