Author_Institution :
Dept. of Electr. Eng., Chung-Cheng Univ., Chia-Yi, Taiwan
Abstract :
A fast skew-compensation circuit is useful for a chip to safely recover from the halt state because it can quickly compensate the clock skew induced by the on-chip clock driver. A low-power half-delay-line fast skew-compensation circuit (HDSC) is proposed in this work. The HDSC circuit features several new design techniques. The first is a new measure-and-compensate architecture, with which the HDSC circuit gains advantages including an enlarged operation frequency range, more robust operation, more accurate phase alignment, higher scalability for using advanced technologies, and lower power consumption, as compared to the conventional fast skew-compensation circuits. The second is a frequency-independent phase adjuster, with which the delay line can be shortened by half and the maximal power consumption is reduced accordingly if the clock signal has a 50% duty cycle. The third is a fine delay cell, which is used to accompany the half-delay-line, comprising of minimum-sized coarse delay cells, to effectively reduce the static phase error. Extensive circuit simulations are carried out to prove the superiority of the proposed circuit. In addition, an HDSC test chip is implemented for performance verification at high frequencies. The test chip is designed based on a 0.35-μm CMOS process, and has a coarse cell delay of 220 ps. It works successfully between 600∼800 MHz, as designed, with a power consumption of 25∼36 μW/MHz. When measured at 616.9 and 791.6 MHz, the static phase error is 76.8 and 124.5 ps, respectively.
Keywords :
CMOS integrated circuits; circuit simulation; clocks; delay circuits; integrated circuit design; low-power electronics; timing jitter; CMOS process; circuit simulations; clock signal; clock skew; coarse delay cells; delay line; fine delay cell; frequency-independent phase adjuster; half-delay-line fast skew-compensation circuit; halt state; measure-and-compensate architecture; on-chip clock driver; operation frequency range; phase alignment; power consumption; static phase error; Circuit testing; Clocks; Delay effects; Driver circuits; Energy consumption; Frequency measurement; Gain measurement; Phase measurement; Power measurement; Semiconductor device measurement; Low power; measure-and-compensate architecture; skew-compensation circuit;