DocumentCode :
997418
Title :
90% write power-saving SRAM using sense-amplifying memory cell
Author :
Kanda, Kouichi ; Sadaaki, Hattori ; Sakurai, Takayasu
Author_Institution :
Syst. LSI Dev. Labs., Kanagawa, Japan
Volume :
39
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
927
Lastpage :
933
Abstract :
This paper describes a low-power write scheme which reduces SRAM power by 90% by using seven-transistor sense-amplifying memory cells. By reducing the bitline swing to VDD/6 and amplifying the voltage swing by a sense-amplifier structure in a memory cell, the charging and discharging component of the power of the bit/data lines is reduced. A 64-kb test chip has been fabricated and correct read/write operation has been verified. It is also shown that the scheme can also have the capability of leakage power reduction with small modifications. Achievable leakage power reduction is estimated to be two orders of magnitude from SPICE simulation results.
Keywords :
CMOS memory circuits; SPICE; SRAM chips; leakage currents; low-power electronics; system-on-chip; SPICE simulation; SRAM power; bitline swing; leakage current; leakage power reduction; low-power write scheme; sense-amplifier structure; sense-amplifying memory cells; test chip; voltage swing; write power; Circuit simulation; Energy consumption; Laboratories; Power dissipation; Random access memory; Read-write memory; SPICE; System-on-a-chip; Testing; Voltage; Leakage current; SRAM; low power; reduced swing; sense-amplifying cell; write power;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.827793
Filename :
1302269
Link To Document :
بازگشت