DocumentCode :
997463
Title :
Correlation between domain wall properties and material parameters in amorphous SmCo-films
Author :
Gronau, M. ; Goeke, H. ; Schuffler, D. ; Sprenger, S.
Author_Institution :
Ruhr-Universität Bochum, Bochum, F.R.G.
Volume :
19
Issue :
5
fYear :
1983
fDate :
9/1/1983 12:00:00 AM
Firstpage :
1653
Lastpage :
1655
Abstract :
Amorphous Sm1-xcox-films with uniaxial in-plane anisotropy with various Co-concentrations x (.67 \\leq x \\leq .91) and various film thicknesses d ( 10nm \\leq d \\leq 350nm ) have been prepared by flash-evaporation of SmCo-alloy powders. The saturation magnetization decreases linearly with x in the whole concentration range, whereas the coercive field increases linearly with x down to x\\approx 74 and then decreases. Drastic changes in all magnetic properties occur when at a given chemical composition the film thickness is reduced below d\\approx 50 nm. Head-on domains are separated by zig-zag walls whose amplitudes are analyzed as a function of the material parameters.
Keywords :
Amorphous magnetic films/devices; Magnetic domains; Magnetic recording/recording materials; Amorphous materials; Anisotropic magnetoresistance; Chemicals; Magnetic analysis; Magnetic domain walls; Magnetic films; Magnetic materials; Magnetic properties; Powders; Saturation magnetization;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062676
Filename :
1062676
Link To Document :
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