Title :
Remote Failure Analysis of Micro-Based Instrumentation
Author :
Zick, G.L. ; Sheffer, T.T.
Author_Institution :
University of Washington
Abstract :
Microprocessors have brought flexibility and versatility to a wide range of instrumentation. They have brought new problems as well. Two such problems–the difficulty of remote reprogramming and the need in certain circumstances for peripheral storage–can be especially troublesome for the design engineer who needs to test his prototype instruments at the site of application.
Keywords :
Computer peripherals; Data acquisition; Digital magnetic recording; Digital recording; Failure analysis; Instruments; Laboratories; Memory; Microprocessors; System performance;
DOI :
10.1109/C-M.1977.217860